Energy Dispersive X-ray Fluorescence (EDXRF) laboratory at AMD, HQ, Hyderabad is equipped with Model EX-6600 having Silicon Drift Detector (SDD) spectrometer of M/s. Xenemetrix make, Israel. EDXRF is a analytical method for quick qualitative scan of elements in a sample and quantitative determination of major and selected trace elements in samples from parts per million (ppm) to percentage level. The analytical precision (%RSD) for major and trace element is within 1-5% and accuracy (% error) is within 10%.
Variety of geological materials such as rock, soil and coal fly ash are being analysed for SiO2, TiO2, Al2O3, Fe2O3(t) MgO, MnO, CaO, Na2O, K2O and P2O5, and selected trace elements such as V, Ni, Cu, Zn, Rb, Sr, Y, Zr, Nb, Pb and Ba.